Testing: The big picture

• The difference between internal and external BW has driven test technology

  1. External test
  
  2. Embedded scan path
  3. High-BW embedded
  4. Embedded source
  5. ???
  

External BW ? (# of I/O) * (external clock rate)

Internal BW ? (# of transistors)* (internal clock rate)

From IEEE Spectrum, 7/99, pgs. 55 / 57

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