Testing and Debugging

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Table of Contents

Testing and Debugging

Logic Probe

Oscilloscope

Logic analyzers

Logic analyzer physical model

Probe pods

Logic analyzer conceptual model

Clocking a logic analyzer

Triggering and acquisition

Modules are semi-autonomous

System window

Module setup window

Module trigger window

Data windows

Capturing glitches

Other features: Activity indicator

Other features: Programmability

Other features: µP support

Testing: The big picture

Semiconductor scaling confounds testing

System-on-a-chip testing

Author: Carl Ebeling

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